IPSN Artifact Evaluation

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Packages embedded sensor-system artifacts including firmware, hardware designs, and datasets for ACM badges and research reproducibility awards.

IPSN Artifact Evaluation provides structured workflows for packaging complex sensor-system and TinyML research artifacts combining hardware schematics, firmware, and dataset traces. It helps researchers qualify for ACM Artifact Badges (Available, Functional, Reusable, Reproduced) and research artifact awards by ensuring evaluators can verify claims without requiring specialized physical bench setups, organizing turnkey figure reproduction pipelines, and managing transitions between double-anonymous review deliverables and public DOI-archived releases.

Key Features

01Guides packaging for mixed hardware, firmware, and dataset research artifacts
021,079 GitHub stars
03Manages dual-stage delivery between double-anonymous review and public DOI archiving
04Maps paper claims and figures directly to validation scripts and expected outputs
05Structures turnkey data-to-figure reproduction pipelines for machine-independent evaluation
06Generates standardized checklist audits targeting ACM badges and artifact awards

Use Cases

01Documenting hardware BOMs, pinned toolchains, and firmware builds for peer review
02Preparing embedded systems and TinyML artifacts for ACM IPSN or SenSys artifact evaluation
03Creating turnkey reproducible figure generation scripts from raw sensor traces